Search results
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 3 > 185 - 192
Journal of Electronic Testing > 2016 > 32 > 3 > 393-397
IEEE Electron Device Letters > 2009 > 30 > 5 > 526 - 528
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1157 - 1160
48th Midwest Symposium on Circuits and Systems, 2005. > 1362 - 1365 Vol. 2